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Our business provides specialized Focused Ion Beam (FIB) equipment and accessories to support advanced laboratories, research institutions, and engineering facilities. We supply high-quality tools and components to ensure reliable performance, system longevity, and precise results in applications such as semiconductor analysis, failure analysis, materials research, and microfabrication.
A dual-beam Focused Ion Beam (FIB) system is a high-precision instrument that combines two powerful imaging and processing technologies in one platform:
Focused Ion Beam (FIB): Uses a finely focused beam of ions to mill, cut, or modify materials at the micro- and nanoscale.
Scanning Electron Microscope (SEM): Provides high-resolution imaging of the sample’s surface.
By integrating both beams, dual-beam FIB devices allow researchers and engineers to simultaneously observe and modify materials with nanometer-level precision, making them essential in chip analysis, defect inspection, and advanced materials research.
Our business provides specialized Focused Ion Beam (FIB) equipment and accessories to support advanced laboratories, research institutions, and engineering facilities. We supply high-quality tools and components to ensure reliable performance, system longevity, and precise results in applications such as semiconductor analysis, failure analysis, materials research, and microfabrication.
A dual-beam Focused Ion Beam (FIB) system is a high-precision instrument that combines two powerful imaging and processing technologies in one platform:
Focused Ion Beam (FIB): Uses a finely focused beam of ions to mill, cut, or modify materials at the micro- and nanoscale.
Scanning Electron Microscope (SEM): Provides high-resolution imaging of the sample’s surface.
By integrating both beams, dual-beam FIB devices allow researchers and engineers to simultaneously observe and modify materials with nanometer-level precision, making them essential in chip analysis, defect inspection, and advanced materials research.